Metal halide perovskite field-effect transistors (MHP-FETs) are of great interest due to the fascinating photonic and electronic properties of perovskite semiconductors, and their low-temperature solution processability. However, present MHP-FETs suffer from the low current-density problem due to the low device mobility, which is an obstacle to their applications. Herein, we tackle this problem by adopting the vertical field-effect transistor (VFET) structure for the fabrication of MHP-VFETs. We show MHP-VFETs can be achieved by employing the MXene (Ti3C2Tx) film as perforated source electrodes, which are essential elements in VFETs, via a simple solution process. The MHP-VFETs exhibit high on/off ratio of 105 and, moreover, show large current density of over 6 mA cm−2, thanks to the ultrashort channel length of the VFETs. Furthermore, the devices are found to exhibit excellent photodetection performance with photoresponsivity of 2.1 × 103 A W−1 and detectivity of 7.84 × 1015 Jones. This study not only provides a route to achieve high-performance MHP-FETs but also shows the very promising prospects of MHP-VFETs for applications as backplane thin-film transistors and high-performance phototransistors.
Skip Nav Destination
Article navigation
10 April 2023
Research Article|
April 13 2023
MXene-based metal halide perovskite vertical field-effect transistors: Toward high current-density and high photodetection performance
Haihong Xie
;
Haihong Xie
(Writing – original draft)
1
International Science and Technology Innovation Cooperation Base for Advanced Display Technologies of Hunan Province, School of Physics and Electronics, Hunan University
, Changsha 410082, China
2
Shenzhen Research Institute of Hunan University
, Shenzhen 518063, China
3
Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University
, Changsha 410082, China
Search for other works by this author on:
Ping-An Chen
;
Ping-An Chen
(Investigation)
1
International Science and Technology Innovation Cooperation Base for Advanced Display Technologies of Hunan Province, School of Physics and Electronics, Hunan University
, Changsha 410082, China
2
Shenzhen Research Institute of Hunan University
, Shenzhen 518063, China
3
Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University
, Changsha 410082, China
Search for other works by this author on:
Xincan Qiu
;
Xincan Qiu
(Investigation)
1
International Science and Technology Innovation Cooperation Base for Advanced Display Technologies of Hunan Province, School of Physics and Electronics, Hunan University
, Changsha 410082, China
2
Shenzhen Research Institute of Hunan University
, Shenzhen 518063, China
Search for other works by this author on:
Yu Liu
;
Yu Liu
(Investigation)
1
International Science and Technology Innovation Cooperation Base for Advanced Display Technologies of Hunan Province, School of Physics and Electronics, Hunan University
, Changsha 410082, China
2
Shenzhen Research Institute of Hunan University
, Shenzhen 518063, China
Search for other works by this author on:
Jiangnan Xia
;
Jiangnan Xia
(Investigation)
1
International Science and Technology Innovation Cooperation Base for Advanced Display Technologies of Hunan Province, School of Physics and Electronics, Hunan University
, Changsha 410082, China
2
Shenzhen Research Institute of Hunan University
, Shenzhen 518063, China
Search for other works by this author on:
Jing Guo
;
Jing Guo
(Investigation)
1
International Science and Technology Innovation Cooperation Base for Advanced Display Technologies of Hunan Province, School of Physics and Electronics, Hunan University
, Changsha 410082, China
Search for other works by this author on:
Huan Wei
;
Huan Wei
(Investigation)
1
International Science and Technology Innovation Cooperation Base for Advanced Display Technologies of Hunan Province, School of Physics and Electronics, Hunan University
, Changsha 410082, China
2
Shenzhen Research Institute of Hunan University
, Shenzhen 518063, China
Search for other works by this author on:
Zhenqi Gong
;
Zhenqi Gong
(Investigation)
1
International Science and Technology Innovation Cooperation Base for Advanced Display Technologies of Hunan Province, School of Physics and Electronics, Hunan University
, Changsha 410082, China
Search for other works by this author on:
Jiaqi Ding
;
Jiaqi Ding
(Investigation)
1
International Science and Technology Innovation Cooperation Base for Advanced Display Technologies of Hunan Province, School of Physics and Electronics, Hunan University
, Changsha 410082, China
Search for other works by this author on:
Yuanyuan Hu
Yuanyuan Hu
a)
(Investigation, Resources, Supervision, Writing – original draft, Writing – review & editing)
1
International Science and Technology Innovation Cooperation Base for Advanced Display Technologies of Hunan Province, School of Physics and Electronics, Hunan University
, Changsha 410082, China
2
Shenzhen Research Institute of Hunan University
, Shenzhen 518063, China
3
Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University
, Changsha 410082, China
a)Author to whom correspondence should be addressed: yhu@hnu.edu.cn
Search for other works by this author on:
a)Author to whom correspondence should be addressed: yhu@hnu.edu.cn
Appl. Phys. Lett. 122, 153301 (2023)
Article history
Received:
January 04 2023
Accepted:
March 31 2023
Citation
Haihong Xie, Ping-An Chen, Xincan Qiu, Yu Liu, Jiangnan Xia, Jing Guo, Huan Wei, Zhenqi Gong, Jiaqi Ding, Yuanyuan Hu; MXene-based metal halide perovskite vertical field-effect transistors: Toward high current-density and high photodetection performance. Appl. Phys. Lett. 10 April 2023; 122 (15): 153301. https://doi.org/10.1063/5.0141280
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Sign in via your Institution
Sign in via your InstitutionPay-Per-View Access
$40.00